Solid-material-based coupling efficiency analyzed with time-of-flight secondary ion mass spectrometry
Muenster, B. / Welle, A. / Ridder, B. / Althuon, D. / Striffler, J. / Foertsch, T. C. / Hahn, L. / Thelen, R. / Stadler, V. / Nesterov-Mueller, A. / Breitling,F. / Loeffler, F., F. (2015)
Applied Surface Science, (2015), 360, 306-314
- Datum: Januar 2016
The coupling behavior of a microparticle embedded amino acid active-ester into a Poly(ethyleneglycol)methacrylate-film, synthesized onto a silicon wafer by a grafting from approach, is characterized using dynamic time-of-flight secondary ion mass spectrometry (ToF-SIMS) to analyze the 3d distribution of the amino acids in the polymer film. Besides standard solid phase peptide synthesis, employing solubilized amino acids in a solvent, we used solid polymer microparticles, incorporating the amino acids. These microparticles were especially designed for a new technique to produce high-density combinatorial peptide microarrays: upon heating, the particles become viscous, which releases the embedded amino acids to diffuse and couple to the surface. In the scope of the development of this new particle-based application, ToF-SIMS is used to analyze a complex chemically modified polymer surface layer. Due to depth profile measurements, it is possible to investigate the particle-based coupling reaction not only on the surface, but also into the depth of the PEGMA film.