Secondary Ion Mass Spectrometry
A large variety of substrates -inorganic hard materials like amorphous carbon, also polymers, and self assembled monolayers as well as solar cells and membranes- can be characterized with SIMS.
Here, a Time-of-Flight Secondary Ion Mass Spectromter (TOF.SIMS5 instrument, ION-TOF, Münster) is applied. ToF-SIMS determines the atomic and molecular composition of the topmost layer of a solid sample. Therefore, the surface is bombarded with high energy Bi clusters (primary ions). Sputtered secondary ions of the sample are separated in a time-of-flight system and counted. Data can be presented as images with lateral resolutions of 300-3000 nm. If the material of the sample is eroded under the ion bombardment a depth profile is obtained.
These analytics are offered through the Karlsruhe Nano Micro Facility for collaborative projects.