Analysis methods
Atomic force microscopy (AFM) |
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Quartz crystal microbalance with dissipation-monitoring (QCM-D) |
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Surface plasmon resonance spectroscopy (Surface plasmon resonance - SPR - spectroscopy) |
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Dr. Alexei Nefedov
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Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy |
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Dr. Peter Weidler
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Surface measurement and porosity determination |
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Dr. Peter Weidler
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X-ray diffractometry ( X-ray Diffractometry-XRD) |
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Environmental Scanning Electron Microscope with Field Emission Cathode (ESEM-FEG) |
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Stefan Heissler
Raman spectroscopy |
Stefan Heissler
IR Spectroscopy |