Analysis methods
Peter Krolla
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Atomic force microscopy (AFM) |
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Dr. Alexander Welle
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Surface plasmon resonance spectroscopy (Surface plasmon resonance - SPR - spectroscopy) |
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Dr. Alexei Nefedov
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Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy |
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Dr. Peter Weidler
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X-ray diffractometry ( X-ray Diffractometry-XRD) |
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Dr. Matthias Schwotzer
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Environmental Scanning Electron Microscope with Field Emission Cathode (ESEM-FEG) |
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Stefan Heissler
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Raman spectroscopy |
Stefan Heissler
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IR Spectroscopy |