Institute of Functional Interfaces

X-ray Diffractometry XRD

With the help of X-ray Diffractometry (XRD) the structure of solid state body can be examined. In our institute it is applied mostly for the examination of the structure and crystallinity of the MOFs.

For this, two machines are operative:

For the out-of-plane measurement a Bruker D8 Advance, with which the distances of the lattice planes parallel to the substrate are determined, and

for the in-plane measurement a Bruker D8 Discover, with which the distances of the lattice planes perpendicular to the substrate are determined.






Out-of-plane and in-plane diffractogram of a MOF.


For powder XRD (PXRD) beside the D8 Advance, there is a Siemens D5000 available.







Classification: X-Ray Diffractometry (XRD/ GID/XRR)




  • Bruker D8 Advance in Bragg-Brentano geometry (θ - θ setup) for out-of-plane measurements (coplanar geometry) with PSD Lynxeye (192 Si-strip detector), 9-fold sample holder, Cu-radiation

  • Bruker D8 Discover, centric-Eulerian quarter cradle PSD Lynxeye (192 Si-strip detector), tilt-stage, Cu-radiation for in-plane (non-coplanar) and X-ray reflectometry

  • Siemens D5000 Bragg-Brentano geometry, θ - 2θ setup, Graphite-monochromator, scintillation counter, 40-fold sample holder

  • Paar HTK 1200 heating stage (up to 1200°C in air and protective gas atmosphere)



Keywords: XRD, GID, XRR