Institute of Functional Interfaces

Bruker Senterra

Spezifikationen: Atomic force microscope (AFM)

Device Designation: Micro Raman
Classification: Confocal Raman Microscope
Description/Features:  
  • Raman Microscope for 2D and 3D mapping.
  • Laser excitation wavelength 532nm, 785nm and (in combination with RAM II) 1065nm
Keywords: