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The controlled growth of oriented metal organic frameworks on functionalized surfaces as followed by Scanning Force Microscopy

The controlled growth of oriented metal organic frameworks on functionalized surfaces as followed by Scanning Force Microscopy
chair:

Munuera, C. / Shekhah, O. / Wang, H. / Wöll, C. / Ocal, C. (2008)

place:

Phys. Chem. Chem. Phys. 10 (2008), 7257-7261

Date: 2008

Munuera, C. / Shekhah, O. / Wang, H. / Wöll, C. / Ocal, C. (200): „The controlled growth of oriented metal organic frameworks on functionalized surfaces as followed by Scanning Force Microscopy“. In: Phys. Chem. Chem. Phys. 10 (2008), 7257-7261

Abstract

Metal–organic frameworks (MOFs) selectively grown on COOH-functionalized surfaces have been investigated by scanning force microscopy. Thickness and surface roughness analysis reveals that the use of a novel protocol based on a layer-by-layer approach results in a controlled growth yielding extremely homogeneous and preferentially oriented materials. The results are described within a sequential growth model and turn out to be promising for building up MOF-based 3D architectures of high quality.


 

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