We analyse different substrates (from inorganic hard materials like amorphous carbon, to polymers, solar cells, membranes, SurMOFs, SurGels and Self Assembled Monolayers) which can be tailored by tuning their surface chemistries.
In house Time-of-Flight Secondary Ion Mass Spectrometry (TOF.SIMS5, ION-TOF, Münster) is applied. ToF-SIMS determines the atomic and molecular composition of the topmost layer of a solid sample. Therefore, the surface is bombarded with high energy Bi clusters (primary ions). Sputtered secondary ions of the sample are separated in a time of flight system and counted. Data can be presented as images with lateral resolutions of 300-3000nm. If the material of the sample is eroded under the ion bombardment a depth profile is obtained.