Institut für Funktionelle Grenzflächen (IFG)

The controlled growth of oriented metal organic frameworks on functionalized surfaces as followed by Scanning Force Microscopy

  • Autor:

    Munuera, C. / Shekhah, O. / Wang, H. / Wöll, C. / Ocal, C. (2008)

  • Quelle:

    Phys. Chem. Chem. Phys. 10 (2008), 7257-7261

  • Datum: 2008
  • Munuera, C. / Shekhah, O. / Wang, H. / Wöll, C. / Ocal, C. (200): „The controlled growth of oriented metal organic frameworks on functionalized surfaces as followed by Scanning Force Microscopy“. In: Phys. Chem. Chem. Phys. 10 (2008), 7257-7261

Abstract

Metal–organic frameworks (MOFs) selectively grown on COOH-functionalized surfaces have been investigated by scanning force microscopy. Thickness and surface roughness analysis reveals that the use of a novel protocol based on a layer-by-layer approach results in a controlled growth yielding extremely homogeneous and preferentially oriented materials. The results are described within a sequential growth model and turn out to be promising for building up MOF-based 3D architectures of high quality.


 

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