Home | english  | Impressum | Sitemap | KIT
Ansprechpartner
Dr. Lars Heinke

Priv.-Doz. Dr. Lars Heinke

+49-721-608-2-2319
+49-721-608-2-3478
E-Mail

Local work function differences at line defects on aluminium oxide on NiAl(110)

Local work function differences at line defects on aluminium oxide on NiAl(110)
Autor:

Heinke, L. / Lichtenstein, L. / Simon, G. / König, T. / Heyde, M. / Freund, H. (2010)

Quelle:

ChemPhysChem 11 (2010), 10, 2085–2087

Datum: 2010

Heinke, L. / Lichtenstein, L. / Simon, G. / König, T. / Heyde, M. / Freund, H. (2010): „Local work function differences at line defects on aluminium oxide on NiAl(110)“. In: ChemPhysChem 11 (2010), 10, 2085–2087

Abstract

PDF ONLINE

PDF_IconDownload

Icon_JPEG Web

A dual-mode FM–AFM/STM is used to study the local variation of the work function on thin film aluminium oxide on NiAl(110). The contact potential difference, that is, the differences of the work functions between tip and sample, significantly decreases at line defects (see figure). An STM picture of the film area, where the contact potential is determined, is plotted in the background.