Defects in MOFs: A Thorough Characterization

  • Autor:

    Petkov, P. / Vayssilov, G. / Liu, J. / Shekhah, O. / Wang, Y. / Wöll, C. / Heine, T. (2012)
  • Quelle:

    ChemPhysChem 13 (2012), 2025–2029
  • Datum: 2012

  • Petkov, P. / Vayssilov, G. / Liu, J. / Shekhah, O. / Wang, Y. / Wöll, C. / Heine, T. (2012): „Defects in MOFs: A Thorough Characterization”. In: ChemPhysChem 13 (2012), 2025–2029

Abstract

As indicated by nearly perfect XRD data, but challenged by a two-signal IR spectrum of CO guest molecules, it is confirmed by computer simulations and XPS experiments that the most defect-free SURMOFs contain about 4 % defective Cu sites.

 

 

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