A defect-free thin film pentacene diode: Interplay between transport and scanning tunneling microscope tip tunneling injection

  • chair: Ruppel, L. / Birkner, A. / Witte, G. / Busse, C. / Lindner, Th. / Paasch, G. / Wöll, Ch. (2007)

  • place: J. Appl. Phys. 102 (2007), 033708

  • Date: 2007
  • Ruppel, L. / Birkner, A. / Witte, G. / Busse, C. / Lindner, Th. / Paasch, G. / Wöll, Ch. (2007): "A defect-free thin film pentacene diode: Interplay between transport and scanning tunneling microscope tip tunneling injection". In: J. Appl. Phys. 102 (2007), 033708

Abstract

The adsorption of naphthalene, vacuum deposited on a Ag(1 0 0) surface, was comprehensively investigated by means of low-energy electron diffraction (LEED), temperature-programmed thermal desorption (TPD) spectroscopy, X-ray photoelectron spectroscopy (XPS), and polarization-dependent near-edge X-ray absorption fine structure (NEXAFS) spectroscopy in the mono- and multilayer regime.

A growth of long-range ordered monolayer at 140 K is observed with LEED. The polarization-dependent C 1s NEXAFS shows that the naphthalene molecules in the monolayer lie almost parallel to the Ag(1 0 0) surface. With increasing film thickness, the molecular orientation turns to upright position. Furthermore, NEXAFS measurements show that in the multilayer regime the molecular orientation depends on the substrate temperature during deposition.


 

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